Publication:
Impact of Ge content and recess depth on the leakage current in strained Si1-xGex/Si heterojunctions
Date
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-5218-4046 | |
| cris.virtual.orcid | 0000-0002-5849-3384 | |
| cris.virtualsource.department | 715a9ada-0798-46d2-a8ca-4775db9a8e46 | |
| cris.virtualsource.department | db73cf2d-2000-429c-bc92-553a1ef3e876 | |
| cris.virtualsource.orcid | 715a9ada-0798-46d2-a8ca-4775db9a8e46 | |
| cris.virtualsource.orcid | db73cf2d-2000-429c-bc92-553a1ef3e876 | |
| dc.contributor.author | Luque Rodriguez, Abraham | |
| dc.contributor.author | Bargallo Gonzalez, Mireia | |
| dc.contributor.author | Eneman, Geert | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Kobayashi, Daisuke | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Jiménez Tejada, Juan A. | |
| dc.contributor.imecauthor | Eneman, Geert | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-19T15:48:47Z | |
| dc.date.available | 2021-10-19T15:48:47Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2011 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19347 | |
| dc.source.beginpage | 2362 | |
| dc.source.endpage | 2370 | |
| dc.source.issue | 8 | |
| dc.source.journal | IEEE Transactions on Electron Devices | |
| dc.source.volume | 58 | |
| dc.title | Impact of Ge content and recess depth on the leakage current in strained Si1-xGex/Si heterojunctions | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |