Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Metrology for implanted Si substrate and dopant loss studies
Publication:
Metrology for implanted Si substrate and dopant loss studies
Copy permalink
Date
2009
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
18997.pdf
147.69 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Radisic, Dunja
;
Shamiryan, Denis
;
Mannaert, Geert
;
Boullart, Werner
;
Rosseel, Erik
;
Bogdanowicz, Janusz
;
Goossens, Jozefien
;
Marrant, Koen
;
Bender, Hugo
Journal
Abstract
Description
Metrics
Downloads
1
since deposited on 2021-10-18
Acq. date: 2025-12-11
Views
1899
since deposited on 2021-10-18
Acq. date: 2025-12-11
Citations
Metrics
Downloads
1
since deposited on 2021-10-18
Acq. date: 2025-12-11
Views
1899
since deposited on 2021-10-18
Acq. date: 2025-12-11
Citations