Publication:
Analysis of temperature-induced saturation threshold voltage degradation in deep-submicron ultrathin SOI MOSFETs
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1865 since deposited on 2021-10-16
4last month
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Acq. date: 2025-12-08
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Views
1865 since deposited on 2021-10-16
4last month
1last week
Acq. date: 2025-12-08
Citations