Publication:
Analysis of temperature-induced saturation threshold voltage degradation in deep-submicron ultrathin SOI MOSFETs
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1866 since deposited on 2021-10-16
1last month
Acq. date: 2026-01-11
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Views
1866 since deposited on 2021-10-16
1last month
Acq. date: 2026-01-11
Citations