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Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies
Publication:
Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies
Date
2021
Proceedings Paper
https://doi.org/10.1109/ICICDT51558.2021.9626482
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franco, Jacopo
;
Arimura, Hiroaki
;
de Marneffe, Jean-Francois
;
Vandooren, Anne
;
Ragnarsson, Lars-Ake
;
Wu, Z.
;
Claes, D.
;
Dentoni Litta, Eugenio
;
Horiguchi, Naoto
;
Croes, Kristof
;
Linten, Dimitri
;
Grasser, T.
;
Kaczer, Ben
Journal
na
Abstract
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1479
since deposited on 2022-09-19
Acq. date: 2025-10-28
Citations
Metrics
Views
1479
since deposited on 2022-09-19
Acq. date: 2025-10-28
Citations