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Measuring and Analyzing Contact Hole Variations in EUV Lithography
Publication:
Measuring and Analyzing Contact Hole Variations in EUV Lithography
Date
2021
Proceedings Paper
https://doi.org/10.1117/12.2585308
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Severi, Joren
;
Mack, Chris A.
;
Lorusso, Gian
;
De Simone, Danilo
Journal
Proceedings of SPIE
Abstract
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1851
since deposited on 2022-03-11
Acq. date: 2025-10-28
Citations
Metrics
Views
1851
since deposited on 2022-03-11
Acq. date: 2025-10-28
Citations