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A model of threading dislocation density in strain-relaxed Ge and GaAs epitaxial films on Si (100)
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A model of threading dislocation density in strain-relaxed Ge and GaAs epitaxial films on Si (100)
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Date
2009-03
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wang, Gang
;
Loo, Roger
;
Simoen, Eddy
;
Souriau, Laurent
;
Caymax, Matty
;
Heyns, Marc
;
Blanpain, Bart
Journal
Applied Physics Letters
Abstract
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2014
since deposited on 2021-10-18
3
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
2014
since deposited on 2021-10-18
3
last month
Acq. date: 2025-12-11
Citations