Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
A novel resist and post-etch residue removal process using ozonated chemistries
Publication:
A novel resist and post-etch residue removal process using ozonated chemistries
Date
1998
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
2416.pdf
429.82 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Gendt, Stefan
;
Snee, Peter
;
Cornelissen, Ingrid
;
Lux, Marcel
;
Vos, Rita
;
Mertens, Paul
;
Knotter, D. M.
;
Heyns, Marc
Journal
Abstract
Description
Metrics
Views
2042
since deposited on 2021-09-30
Acq. date: 2025-10-24
Citations
Metrics
Views
2042
since deposited on 2021-09-30
Acq. date: 2025-10-24
Citations