Publication:
Complete degradation mapping of stacked gate-all-around Si nanowire transistors considering both intrinsic and extrinsic effects
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1970 since deposited on 2021-10-24
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Acq. date: 2026-09-12
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1970 since deposited on 2021-10-24
1last month
1last week
Acq. date: 2026-09-12
Citations