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OrbitrapTM-SIMS analysis of advanced semiconductor inorganic structures

 
dc.contributor.authorFranquet, Alexis
dc.contributor.authorSpampinato, Valentina
dc.contributor.authorKayser, S.
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorvan der Heide, Paul
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorSpampinato, Valentina
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.contributor.orcidimecSpampinato, Valentina::0000-0003-3225-6740
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.date.accessioned2022-09-01T14:05:06Z
dc.date.available2022-06-17T02:26:47Z
dc.date.available2022-09-01T14:05:06Z
dc.date.issued2022
dc.description.wosFundingTextThe authors gratefully acknowledge Alexander Pirkl (IONTOF, Germany) for measurements and discussion, Roger Loo (imec, Belgium) and Bernardette Kunert (imec, Belgium) for sample preparation and discussion. This project has partly received funding from the ECSEL Joint Undertaking (JU) under grant agreement No 875999. The JU receives support from the European Union's Horizon 2020 research and innovation programme and Netherlands, Belgium, Germany, France, Austria, Hungary, United Kingdom, Romania, Israel.
dc.identifier.doi10.1016/j.vacuum.2022.111182
dc.identifier.issn0042-207X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39964
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.beginpage111182
dc.source.issuena
dc.source.journalVACUUM
dc.source.numberofpages7
dc.source.volume202
dc.subject.keywordsSELF-FOCUSING SIMS
dc.subject.keywordsMASS
dc.title

OrbitrapTM-SIMS analysis of advanced semiconductor inorganic structures

dc.typeJournal article
dspace.entity.typePublication
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