Publication:
Correlation of interface states/border traps and threshold voltage shift on AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistors
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1966 since deposited on 2021-10-23
1last month
Acq. date: 2026-02-25
Citations
Statistics
Views
1966 since deposited on 2021-10-23
1last month
Acq. date: 2026-02-25
Citations