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Articles
Low-frequency noise asesssment of the silicon passivation of Ge pMOSFETs
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Low-frequency noise asesssment of the silicon passivation of Ge pMOSFETs
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Date
2010
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Firrincieli, Andrea
;
Leys, Frederik
;
Loo, Roger
;
De Jaeger, Brice
;
Mitard, Jerome
;
Claeys, Cor
Journal
Thin Solid Films
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1843
since deposited on 2021-10-18
Acq. date: 2025-12-16
Citations
Metrics
Views
1843
since deposited on 2021-10-18
Acq. date: 2025-12-16
Citations