Publication:

Low-frequency noise asesssment of the silicon passivation of Ge pMOSFETs

Date

2010
Journal article
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorFirrincieli, Andrea
dc.contributor.authorLeys, Frederik
dc.contributor.authorLoo, Roger
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorMitard, Jerome
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorFirrincieli, Andrea
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorMitard, Jerome
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.accessioned2021-10-18T21:35:43Z
dc.date.available2021-10-18T21:35:43Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.issn0040-6090
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17988
dc.source.beginpage2493
dc.source.endpage2496
dc.source.issue9
dc.source.journalThin Solid Films
dc.source.volume518
dc.title

Low-frequency noise asesssment of the silicon passivation of Ge pMOSFETs

dc.typeJournal article
dspace.entity.typePublication
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