Publication:
Impact of vacuum ultraviolet photons on ultrathin polymethylmethacrylate during plasma etching
| dc.contributor.author | Arvind, Shikhar | |
| dc.contributor.author | Witting Larsen, Esben | |
| dc.contributor.author | Bezard, Philippe | |
| dc.contributor.author | Petersen, John | |
| dc.contributor.author | De Gendt, Stefan | |
| dc.contributor.imecauthor | Arvind, Shikhar | |
| dc.contributor.imecauthor | Bezard, Philippe | |
| dc.contributor.imecauthor | Petersen, John | |
| dc.contributor.imecauthor | De Gendt, Stefan | |
| dc.contributor.imecauthor | Witting Larsen, Esben | |
| dc.contributor.orcidimec | Arvind, Shikhar::0000-0002-4748-7763 | |
| dc.contributor.orcidimec | Bezard, Philippe::0000-0003-2499-0240 | |
| dc.contributor.orcidimec | Petersen, John::0000-0003-4815-3770 | |
| dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
| dc.contributor.orcidimec | Witting Larsen, Esben::0000-0002-6294-0896 | |
| dc.date.accessioned | 2024-09-19T14:21:46Z | |
| dc.date.available | 2024-05-02T17:47:54Z | |
| dc.date.available | 2024-09-19T14:21:46Z | |
| dc.date.embargo | 2024-03-18 | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | The authors acknowledge funding from the imec Industrial Affiliation Program (IIAP). Shikhar Arvind acknowledges funding from KU Leuven for their doctoral studies. The authors would like to thank Shreya Kundu of imec for their help with IBE tool. The authors would also like to thank Materials Characterization and Analysis (MCA) group at imec for their help with AFM and XPS analysis. | |
| dc.identifier.doi | 10.1116/6.0003541 | |
| dc.identifier.issn | 0734-2101 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43892 | |
| dc.publisher | A V S AMER INST PHYSICS | |
| dc.source.beginpage | Art. 033009 | |
| dc.source.endpage | N/A | |
| dc.source.issue | 3 | |
| dc.source.journal | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | |
| dc.source.numberofpages | 9 | |
| dc.source.volume | 42 | |
| dc.subject.keywords | 193 NM PHOTORESIST | |
| dc.subject.keywords | EUV LITHOGRAPHY | |
| dc.subject.keywords | ION | |
| dc.subject.keywords | PMMA | |
| dc.subject.keywords | SURFACE | |
| dc.subject.keywords | ARGON | |
| dc.subject.keywords | POLY(METHYLMETHACRYLATE) | |
| dc.subject.keywords | RADIATION | |
| dc.subject.keywords | FILMS | |
| dc.subject.keywords | VUV | |
| dc.title | Impact of vacuum ultraviolet photons on ultrathin polymethylmethacrylate during plasma etching | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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