Publication:

Analysis of junctions formed in strained Si/SiGe substrates

Date

2004

Proceedings Paper

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Author(s)

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Lindsay, Richard

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Verheyen, Peter

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Delhougne, Romain

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Meunier-Beillard, Philippe

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Demuynck, Steven

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De Meyer, Kristin

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Vandervorst, Wilfried

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