Publication:

Analysis of junctions formed in strained Si/SiGe substrates

Date

2004
Proceedings Paper
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Author(s)

Eneman, Geert  
;
Simoen, Eddy  
;
Lauwers, Anne  
;
Lindsay, Richard
;
Verheyen, Peter  
;
Delhougne, Romain  
;
Loo, Roger  
;
Caymax, Matty  
;
Meunier-Beillard, Philippe
;
Demuynck, Steven  
;
De Meyer, Kristin  
;
Vandervorst, Wilfried  

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1925 since deposited on 2021-10-15
Acq. date: 2025-10-23

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