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Reliability of Mo as Word Line Metal in 3D NAND
Publication:
Reliability of Mo as Word Line Metal in 3D NAND
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Date
2021
Proceedings Paper
https://doi.org/10.1109/IRPS46558.2021.9405132
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2021015710.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tierno, Davide
;
Croes, Kristof
;
Ajaykumar, Arjun
;
Ramesh, Siva
;
Van den Bosch, Geert
;
Rosmeulen, Maarten
Journal
na
Abstract
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Statistics
Downloads
694
since deposited on 2021-11-02
54
last month
9
last week
Acq. date: 2026-05-17
Views
1678
since deposited on 2021-11-02
2
last month
1
last week
Acq. date: 2026-05-17
Citations