Publication:
GIDL behavior with different TiN metal gate thickness and high-k gate dielectric on MuGFET devices
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1872 since deposited on 2021-10-19
1last month
Acq. date: 2026-01-25
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Statistics
Views
1872 since deposited on 2021-10-19
1last month
Acq. date: 2026-01-25
Citations