Publication:
SiGe or GeSn source/drain stressors on strained SiGe-channel pFETS: a TCAD study
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1789 since deposited on 2021-10-20
Acq. date: 2026-04-05
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Statistics
Views
1789 since deposited on 2021-10-20
Acq. date: 2026-04-05
Citations