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HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale
Publication:
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale
Date
2020
Journal article
https://doi.org/10.1016/j.ultramic.2020.113099
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jannis, D.
;
Guzzinati, G.
;
Beche, A.
;
Verbeeck, J.
;
Prabhakara, Viveksharma
;
Bender, Hugo
Journal
ULTRAMICROSCOPY
Abstract
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1942
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Acq. date: 2025-12-08
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Metrics
Views
1942
since deposited on 2021-11-02
2
last month
2
last week
Acq. date: 2025-12-08
Citations