Publication:

HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale

Date

2020
Journal article
https://doi.org/10.1016/j.ultramic.2020.113099
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dc.contributor.authorJannis, D.
dc.contributor.authorGuzzinati, G.
dc.contributor.authorBeche, A.
dc.contributor.authorVerbeeck, J.
dc.contributor.authorPrabhakara, Viveksharma
dc.contributor.authorBender, Hugo
dc.contributor.imecauthorPrabhakara, V
dc.contributor.imecauthorBender, H.
dc.contributor.imecauthorPrabhakara, Viveksharma
dc.contributor.imecauthorBender, Hugo
dc.contributor.orcidextVerbeeck, J.::0000-0002-7151-8101
dc.date.accessioned2021-12-02T13:17:39Z
dc.date.available2021-11-02T16:07:03Z
dc.date.available2021-12-02T13:17:39Z
dc.date.issued2020
dc.identifier.doi10.1016/j.ultramic.2020.113099
dc.identifier.issn0304-3991
dc.identifier.pmidMEDLINE:32896758
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38334
dc.publisherELSEVIER
dc.source.beginpage113099
dc.source.issuena
dc.source.journalULTRAMICROSCOPY
dc.source.numberofpages10
dc.source.volume219
dc.subject.keywordsBEAM ELECTRON-DIFFRACTION
dc.subject.keywordsDRIFT
dc.subject.keywordsMICROSCOPY
dc.subject.keywordsDISTORTION
dc.subject.keywordsDEVICES
dc.subject.keywordsSI
dc.title

HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale

dc.typeJournal article
dspace.entity.typePublication
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