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Breakdown and defect generation in ultra-thin gate oxide
Publication:
Breakdown and defect generation in ultra-thin gate oxide
Date
1996
Journal article
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1182.pdf
283.81 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Depas, Michel
;
Vermeire, Bert
;
Heyns, Marc
Journal
Journal of Applied Physics
Abstract
Description
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1932
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1932
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations