Publication:

Nanobeam diffraction strain analysis of released Ge gate-all-around nano-wires: challenges and limitations

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1934 since deposited on 2021-10-25
1last month
Acq. date: 2025-12-15

Citations

Metrics

Views

1934 since deposited on 2021-10-25
1last month
Acq. date: 2025-12-15

Citations