Publication:

Scaling Cu/SiCN Wafer-to-Wafer Hybrid Bonding down to 400 nm interconnect pitch

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345 since deposited on 2024-12-07
3last month
Acq. date: 2026-02-27

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Views

345 since deposited on 2024-12-07
3last month
Acq. date: 2026-02-27

Citations