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Scaling Cu/SiCN Wafer-to-Wafer Hybrid Bonding down to 400 nm interconnect pitch
Publication:
Scaling Cu/SiCN Wafer-to-Wafer Hybrid Bonding down to 400 nm interconnect pitch
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Date
2024
Proceedings Paper
https://doi.org/10.1109/ECTC51529.2024.00058
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Boyao
;
Chew, Soon Aik
;
Stucchi, Michele
;
Dewilde, Sven
;
Iacovo, Serena
;
Witters, Liesbeth
;
Webers, Tomas
;
Van Sever, Koen
;
De Vos, Joeri
;
Miller, Andy
;
Beyer, Gerald
;
Beyne, Eric
Journal
N/A
Abstract
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337
since deposited on 2024-12-07
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Acq. date: 2026-01-09
Citations
Metrics
Views
337
since deposited on 2024-12-07
3
last month
1
last week
Acq. date: 2026-01-09
Citations