Publication:

Scaling Cu/SiCN Wafer-to-Wafer Hybrid Bonding down to 400 nm interconnect pitch

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414 since deposited on 2024-12-07
27last month
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Acq. date: 2026-10-06

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Views

414 since deposited on 2024-12-07
27last month
4last week
Acq. date: 2026-10-06

Citations