Publication:
Dose rate dependence of the back gate degradation in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
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1959 since deposited on 2021-10-16
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Acq. date: 2026-01-10
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1959 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-01-10
Citations