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Investigation of performance improvement and gate-to-junction leakage reduction fot the 90nm CMOS gate stack architecture
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Investigation of performance improvement and gate-to-junction leakage reduction fot the 90nm CMOS gate stack architecture
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Date
2002
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6305.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Henson, Kirklen
;
Kubicek, Stefan
;
Redolfi, Augusto
;
De Meyer, Kristin
;
Jurczak, Gosia
;
Augendre, Emmanuel
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1870
since deposited on 2021-10-14
Acq. date: 2026-01-08
Citations
Metrics
Views
1870
since deposited on 2021-10-14
Acq. date: 2026-01-08
Citations