Publication:

Superior reliability of high mobility (Si)Ge channel pMOSFETs

Date

2013

Journal article

Simple item page Full metadata Statistics

Files

26658.pdf 1.19 MB

Author(s)

;

;

Toledano Luque, Maria

;

Roussel, Philippe

;

;

Kauerauf, Thomas

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;

;

Witters, Liesbeth

;

;

Groeseneken, Guido

Journal

Microelectronic Engineering

Statistics

1826 since deposited on 2021-10-21

Acq. date: 2026-02-28