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Conference contributions
Experimental verification of SRAM cell functionality after hard and soft gate oxide breakdowns
Publication:
Experimental verification of SRAM cell functionality after hard and soft gate oxide breakdowns
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Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Degraeve, Robin
;
Augendre, Emmanuel
;
Jurczak, Gosia
;
Groeseneken, Guido
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1833
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations
Metrics
Views
1833
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations