Publication:
Experimental verification of SRAM cell functionality after hard and soft gate oxide breakdowns
Date
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Augendre, Emmanuel | |
| dc.contributor.author | Jurczak, Gosia | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Jurczak, Gosia | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-15T05:06:06Z | |
| dc.date.available | 2021-10-15T05:06:06Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7715 | |
| dc.source.beginpage | 75 | |
| dc.source.conference | Proceedings 33rd European Solid-State Devices Research Conference - ESSDERC | |
| dc.source.conferencedate | 16/09/2003 | |
| dc.source.conferencelocation | Estoril Portugal | |
| dc.source.endpage | 78 | |
| dc.title | Experimental verification of SRAM cell functionality after hard and soft gate oxide breakdowns | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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