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Discussion on the figures of merit of identified traps located in the Si flm: surface versus volume trap densities
Publication:
Discussion on the figures of merit of identified traps located in the Si flm: surface versus volume trap densities
Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cretu, Bogdan
;
Simoen, Eddy
;
Hellings, Geert
;
Linten, Dimitri
;
Claeys, Cor
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Abstract
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1927
since deposited on 2021-10-28
Acq. date: 2025-12-08
Citations
Metrics
Views
1927
since deposited on 2021-10-28
Acq. date: 2025-12-08
Citations