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Conference contributions
Electrical linewidth metrology for sub-65-nm applications
Publication:
Electrical linewidth metrology for sub-65-nm applications
Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Storms, Greet
;
Cheng, Shaunee
;
Pollentier, Ivan
Journal
Abstract
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1872
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations
Metrics
Views
1872
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations