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Electrical linewidth metrology for sub-65-nm applications
Publication:
Electrical linewidth metrology for sub-65-nm applications
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Storms, Greet
;
Cheng, Shaunee
;
Pollentier, Ivan
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1875
since deposited on 2021-10-15
Acq. date: 2025-12-11
Citations
Metrics
Views
1875
since deposited on 2021-10-15
Acq. date: 2025-12-11
Citations