Publication:
Time-dependent breakdown mechanisms and reliability improvement in edge terminated AlGaN/GaN Schottky diodes under HTRB tests
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1934 since deposited on 2021-10-24
Acq. date: 2026-09-11
Citations
Statistics
Views
1934 since deposited on 2021-10-24
Acq. date: 2026-09-11
Citations