Publication:
Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications
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1931 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-10
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Views
1931 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-10
Citations