Publication:

Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications

Date

2014
Proceedings Paper
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dc.contributor.authorSon, Yunik
dc.contributor.authorNoh, Kyung Bong
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorSchram, Tom
dc.contributor.authorSpessot, Alessio
dc.contributor.authorFazan, Pierre
dc.contributor.authorCho, Moon Ju
dc.contributor.authorFranco, Jacopo
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorThean, Aaron
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorFazan, Pierre
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.accessioned2021-10-22T06:02:17Z
dc.date.available2021-10-22T06:02:17Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24549
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6849377&sortType%3Ddesc_p_Publication_Year%26queryText%3Dritzenth
dc.source.beginpage1
dc.source.conferenceIEEE 6th International Memory Workshop - IMW
dc.source.conferencedate18/05/2014
dc.source.conferencelocationTaipei Taiwan
dc.source.endpage4
dc.title

Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications

dc.typeProceedings paper
dspace.entity.typePublication
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