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Impact of the Nonlinear Dielectric Hysteresis Properties of a Charge Trap Layer in a Novel Hybrid High-Speed and Low-Power Ferroelectric or Antiferroelectric HSO/HZO Boosted Charge Trap Memory
Publication:
Impact of the Nonlinear Dielectric Hysteresis Properties of a Charge Trap Layer in a Novel Hybrid High-Speed and Low-Power Ferroelectric or Antiferroelectric HSO/HZO Boosted Charge Trap Memory
Date
2021
Journal article
https://doi.org/10.1109/TED.2021.3049758
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ali, Tarek
;
Mertens, Konstantin
;
Olivo, Ricardo
;
Rudolph, Matthias
;
Oehler, Sebastian
;
Kuhnel, Kati
;
Lehninger, David
;
Muller, Franz
;
Hoffmann, Raik
;
Schramm, Philipp
;
Biedermann, Kati
;
Metzger, Joachim
;
Binder, Robert
;
Czernohorsky, Malte
;
Kampfe, Thomas
;
Muller, Johannes
;
Seidel, Konrad
;
Van Houdt, Jan
;
Eng, Lukas M.
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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1143
since deposited on 2023-06-20
1
last week
Acq. date: 2025-10-29
Citations
Metrics
Views
1143
since deposited on 2023-06-20
1
last week
Acq. date: 2025-10-29
Citations