Impact of the Nonlinear Dielectric Hysteresis Properties of a Charge Trap Layer in a Novel Hybrid High-Speed and Low-Power Ferroelectric or Antiferroelectric HSO/HZO Boosted Charge Trap Memory

Ali, Tarek; Mertens, Konstantin; Olivo, Ricardo; Rudolph, Matthias; Oehler, Sebastian; Kuhnel, Kati; Lehninger, David; Muller, Franz; Hoffmann, Raik; Schramm, Philipp; Biedermann, Kati; Metzger, Joachim; Binder, Robert; Czernohorsky, Malte; Kampfe, Thomas; Muller, Johannes; Seidel, Konrad; Van Houdt, Jan; Eng, Lukas M.

doi:10.1109/TED.2021.3049758

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Impact of the Nonlinear Dielectric Hysteresis Properties of a Charge Trap Layer in a Novel Hybrid High-Speed and Low-Power Ferroelectric or Antiferroelectric HSO/HZO Boosted Charge Trap Memory

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2021

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https://doi.org/10.1109/TED.2021.3049758

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IEEE TRANSACTIONS ON ELECTRON DEVICES

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1146 since deposited on 2023-06-20

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Acq. date: 2025-12-15

Impact of the Nonlinear Dielectric Hysteresis Properties of a Charge Trap Layer in a Novel Hybrid High-Speed and Low-Power Ferroelectric or Antiferroelectric HSO/HZO Boosted Charge Trap Memory

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