Publication:
A comprehensive reliability investigation of the voltage-, temperature- and device geometry-dependence of the gate degradation on state-of-the-art GaN-on-Si HEMTs
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1981 since deposited on 2021-10-18
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Acq. date: 2026-07-27
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Statistics
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1981 since deposited on 2021-10-18
1last month
1last week
Acq. date: 2026-07-27
Citations