Publication:
Transmission electron microscopy investigation of the crystallographic quality of silicon films grown epitaxially on porous silicon
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Downloads
1 since deposited on 2021-10-14
Acq. date: 2026-02-24
Views
1888 since deposited on 2021-10-14
Acq. date: 2026-02-24
Citations
Statistics
Downloads
1 since deposited on 2021-10-14
Acq. date: 2026-02-24
Views
1888 since deposited on 2021-10-14
Acq. date: 2026-02-24
Citations