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A simple and efficient RF technique for the TSV characterization
Publication:
A simple and efficient RF technique for the TSV characterization
Date
2017
Proceedings Paper
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34958.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sun, Xiao
;
Roda Neve, Cesar
;
Van Huylenbroeck, Stefaan
;
Van der Plas, Geert
;
Beyne, Eric
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Metrics
Views
1929
since deposited on 2021-10-24
419
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations