A simple and efficient RF technique for the TSV characterization

dc.contributor.author	Sun, Xiao
dc.contributor.author	Roda Neve, Cesar
dc.contributor.author	Van Huylenbroeck, Stefaan
dc.contributor.author	Van der Plas, Geert
dc.contributor.author	Beyne, Eric
dc.contributor.imecauthor	Sun, Xiao
dc.contributor.imecauthor	Van Huylenbroeck, Stefaan
dc.contributor.imecauthor	Van der Plas, Geert
dc.contributor.imecauthor	Beyne, Eric
dc.contributor.orcidimec	Van Huylenbroeck, Stefaan::0000-0001-9978-3575
dc.contributor.orcidimec	Van der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimec	Beyne, Eric::0000-0002-3096-050X
dc.date.accessioned	2021-10-24T14:27:21Z
dc.date.available	2021-10-24T14:27:21Z
dc.date.embargo	9999-12-31
dc.date.issued	2017
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/29524
dc.identifier.url	http://ieeexplore.ieee.org/document/7999868/
dc.source.beginpage	1431
dc.source.conference	37th Electronic Components and Technology Conference - ECTC
dc.source.conferencedate	30/05/2017
dc.source.conferencelocation	Lake Buena Vista, FL USA
dc.source.endpage	1436
dc.title	A simple and efficient RF technique for the TSV characterization
dc.type	Proceedings paper
dspace.entity.type	Publication
Files	Original bundle Name: 34958.pdf Size: 683.48 KB Format: Adobe Portable Document Format Download
Publication available in collections:	Conference contributions

Date