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Articles
Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices
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Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lambrecht, Niels
;
Pues, Hugo
;
De Zutter, Daniel
;
Vande Ginste, Dries
Journal
IEEE Transactions on Electromagnetic Compatibility
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1847
since deposited on 2021-10-24
Acq. date: 2025-12-14
Citations
Metrics
Views
1847
since deposited on 2021-10-24
Acq. date: 2025-12-14
Citations