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Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

Date

2017
Journal article
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dc.contributor.authorLambrecht, Niels
dc.contributor.authorPues, Hugo
dc.contributor.authorDe Zutter, Daniel
dc.contributor.authorVande Ginste, Dries
dc.contributor.imecauthorDe Zutter, Daniel
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.accessioned2021-10-24T07:25:58Z
dc.date.available2021-10-24T07:25:58Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.issn0018-9375
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28750
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7723835/
dc.source.beginpage541
dc.source.endpage544
dc.source.issue2
dc.source.journalIEEE Transactions on Electromagnetic Compatibility
dc.source.volume59
dc.title

Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

dc.typeJournal article
dspace.entity.typePublication
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