Publication:
Impact of Si channel thickness and buried oxide quality on the proton radiation behavior of 65 nm FD SOI
Date
| dc.contributor.author | Put, Sofie | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Augendre, Emmanuel | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Van Uffelen, Marco | |
| dc.contributor.author | Leroux, Paul | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T18:49:37Z | |
| dc.date.available | 2021-10-16T18:49:37Z | |
| dc.date.issued | 2007-01 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12741 | |
| dc.source.beginpage | 23 | |
| dc.source.conference | EUROSOI Workshop Proceedings: 3rd Workshop of the Thematic Network on Silicon-on-Insulator Technology, Devices and Circuits | |
| dc.source.conferencedate | 24/01/2007 | |
| dc.source.conferencelocation | Leuven Belgium | |
| dc.source.endpage | 24 | |
| dc.title | Impact of Si channel thickness and buried oxide quality on the proton radiation behavior of 65 nm FD SOI | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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