Publication:

Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications

Date

2021
Proceedings Paper
https://doi.org/10.1109/ESSDERC53440.2021.9631811
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Author(s)

Oh, Hyungrock  
;
Belmonte, Attilio  
;
Perumkunnil, Manu  
;
Mitard, Jerome  
;
Rassoul, Nouredine  
;
Donadio, Gabriele Luca  
;
Delhougne, Romain  
;
Furnemont, Arnaud  
;
Kar, Gouri Sankar  
;
Dehaene, Wim  

Journal

na

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1118 since deposited on 2023-06-20
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Acq. date: 2026-03-17

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