Publication:
Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications
| dc.contributor.author | Oh, Hyungrock | |
| dc.contributor.author | Belmonte, Attilio | |
| dc.contributor.author | Perumkunnil, Manu | |
| dc.contributor.author | Mitard, Jerome | |
| dc.contributor.author | Rassoul, Nouredine | |
| dc.contributor.author | Donadio, Gabriele Luca | |
| dc.contributor.author | Delhougne, Romain | |
| dc.contributor.author | Furnemont, Arnaud | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.author | Dehaene, Wim | |
| dc.contributor.imecauthor | Oh, Hyungrock | |
| dc.contributor.imecauthor | Belmonte, Attilio | |
| dc.contributor.imecauthor | Perumkunnil, Manu | |
| dc.contributor.imecauthor | Mitard, Jerome | |
| dc.contributor.imecauthor | Rassoul, Nouredine | |
| dc.contributor.imecauthor | Donadio, Gabriele Luca | |
| dc.contributor.imecauthor | Delhougne, Romain | |
| dc.contributor.imecauthor | Furnemont, Arnaud | |
| dc.contributor.imecauthor | Kar, Gouri Sankar | |
| dc.contributor.imecauthor | Dehaene, Wim | |
| dc.contributor.orcidimec | Belmonte, Attilio::0000-0002-3947-1948 | |
| dc.contributor.orcidimec | Rassoul, Nouredine::0000-0001-9489-3396 | |
| dc.contributor.orcidimec | Oh, Hyungrock::0000-0001-5244-5755 | |
| dc.contributor.orcidimec | Perumkunnil, Manu::0000-0002-0029-6548 | |
| dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
| dc.contributor.orcidimec | Furnemont, Arnaud::0000-0002-6378-1030 | |
| dc.date.accessioned | 2023-08-10T09:00:31Z | |
| dc.date.available | 2023-06-20T10:34:21Z | |
| dc.date.available | 2023-08-10T09:00:31Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/ESSDERC53440.2021.9631811 | |
| dc.identifier.eisbn | 978-1-6654-3748-6 | |
| dc.identifier.issn | 1930-8876 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41845 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 275 | |
| dc.source.conference | IEEE 51st European Solid-State Device Research Conference (ESSDERC) | |
| dc.source.conferencedate | SEP 06-09, 2021 | |
| dc.source.conferencelocation | Grenoble | |
| dc.source.endpage | 278 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 4 | |
| dc.title | Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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