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Statistical model for SILC and pre-breakdown current jumps in ultra-thin oxide layers
Publication:
Statistical model for SILC and pre-breakdown current jumps in ultra-thin oxide layers
Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Kaczer, Ben
;
Schuler, Franz
;
Lorenzini, Martino
;
Wellekens, Dirk
;
Hendrickx, Paul
;
Van Houdt, Jan
;
Haspeslagh, Luc
;
Tempel, Georg
;
Groeseneken, Guido
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1872
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1872
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations