Publication:

Statistical model for SILC and pre-breakdown current jumps in ultra-thin oxide layers

Date

2001
Proceedings Paper
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dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.authorSchuler, Franz
dc.contributor.authorLorenzini, Martino
dc.contributor.authorWellekens, Dirk
dc.contributor.authorHendrickx, Paul
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorTempel, Georg
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorHendrickx, Paul
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-14T16:49:12Z
dc.date.available2021-10-14T16:49:12Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5230
dc.source.beginpage121
dc.source.conferenceIEDM Technical Digest
dc.source.conferencedate2/12/2001
dc.source.conferencelocationWashington, D.C. USA
dc.source.endpage4
dc.title

Statistical model for SILC and pre-breakdown current jumps in ultra-thin oxide layers

dc.typeProceedings paper
dspace.entity.typePublication
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