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Articles
Electron-induced fragmentation mechanisms in organic monomers and their implications for photoresist optimization for EUV lithography
Publication:
Electron-induced fragmentation mechanisms in organic monomers and their implications for photoresist optimization for EUV lithography
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Date
2021
Journal article
https://doi.org/10.1039/d1cp00065a
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rathore, Ashish
;
Cipriani, Maicol
;
Huang, Ching-Chung
;
Amiaud, Lionel
;
Dablemont, Celine
;
Lafosse, Anne
;
Ingolfsson, Oddur
;
De Simone, Danilo
;
De Gendt, Stefan
Journal
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
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1345
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Acq. date: 2026-01-05
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Metrics
Views
1345
since deposited on 2021-11-02
2
last month
1
last week
Acq. date: 2026-01-05
Citations