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A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides
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A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides
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Date
1996
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
De Blauwe, Jan
;
Ogier, Jean-Luc
;
Roussel, Philippe
;
Groeseneken, Guido
;
Maes, Herman
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Acq. date: 2025-12-12
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2026
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-12
Citations