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Bias Temperature Instability in CMOS Digital Circuits from Planar to FinFET Nodes
Publication:
Bias Temperature Instability in CMOS Digital Circuits from Planar to FinFET Nodes
Date
2015-04
Dissertation
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43308.pdf
9.49 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kukner, Halil
Journal
Abstract
Description
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Views
1945
since deposited on 2021-10-22
Acq. date: 2025-10-29
Citations
Metrics
Views
1945
since deposited on 2021-10-22
Acq. date: 2025-10-29
Citations