Publication:

Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells

Date

2020
Proceedings Paper
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Author(s)

Ali, T.
;
Kuehnel, K.
;
Czernohorsky, M.
;
Rudolph, M.
;
Paetzold, B.
;
Olivo, R.
;
Lehninger, D.
;
Mertens, K.
;
Mueller, F.
;
Lederer, M.
;
Hoffmann, R.
;
Mart, C.
;
Kalkani, M. N.
;
Steinke, P.
;
Kaempfe, T.
;
Mueller, J.
;
Seidel, K.
;
Eng, L. M.
;
Van Houdt, Jan  

Journal

na

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