Publication:
Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells
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1806 since deposited on 2021-11-02
2last month
Acq. date: 2025-12-15
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Metrics
Views
1806 since deposited on 2021-11-02
2last month
Acq. date: 2025-12-15
Citations