Publication:

Mobility and carrier concentration measurements on nm-wide semiconductor fins

Date

2018-06

Meeting abstract

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Author(s)

Witthoft, M.-L.

;

Folkersma, Steven

;

Bogdanowicz, Janusz

;

;

;

Porret, Clément

;

;

Henrichsen, H.H.

;

;

Vandervorst, Wilfried

;

Metrics

1973 since deposited on 2021-10-26

Acq. date: 2025-12-14