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Conference contributions
Mobility and carrier concentration measurements on nm-wide semiconductor fins
Publication:
Mobility and carrier concentration measurements on nm-wide semiconductor fins
Date
2018-06
Meeting abstract
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Witthoft, M.-L.
;
Folkersma, Steven
;
Bogdanowicz, Janusz
;
Marangoni, T.
;
Vohra, Anurag
;
Porret, Clément
;
Loo, Roger
;
Henrichsen, H.H.
;
Hansen, O.
;
Vandervorst, Wilfried
;
Petersen, D.H.
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Abstract
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Views
1970
since deposited on 2021-10-26
Acq. date: 2025-10-26
Citations
Metrics
Views
1970
since deposited on 2021-10-26
Acq. date: 2025-10-26
Citations