Publication:

Mobility and carrier concentration measurements on nm-wide semiconductor fins

Date

2018-06
Meeting abstract
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dc.contributor.authorWitthoft, M.-L.
dc.contributor.authorFolkersma, Steven
dc.contributor.authorBogdanowicz, Janusz
dc.contributor.authorMarangoni, T.
dc.contributor.authorVohra, Anurag
dc.contributor.authorPorret, Clément
dc.contributor.authorLoo, Roger
dc.contributor.authorHenrichsen, H.H.
dc.contributor.authorHansen, O.
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorPetersen, D.H.
dc.contributor.imecauthorFolkersma, Steven
dc.contributor.imecauthorBogdanowicz, Janusz
dc.contributor.imecauthorVohra, Anurag
dc.contributor.imecauthorPorret, Clément
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecBogdanowicz, Janusz::0000-0002-7503-8922
dc.contributor.orcidimecVohra, Anurag::0000-0002-2831-0719
dc.contributor.orcidimecPorret, Clément::0000-0002-4561-348X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-26T09:32:44Z
dc.date.available2021-10-26T09:32:44Z
dc.date.issued2018-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32278
dc.source.beginpageI.15.3
dc.source.conferenceE-MRS Spring Meeting Symposium I: Materials Research for Group IV Semiconductors: Growth, Characterization and Technological ...
dc.source.conferencedate18/06/2018
dc.source.conferencelocationStrasbourg France
dc.title

Mobility and carrier concentration measurements on nm-wide semiconductor fins

dc.typeMeeting abstract
dspace.entity.typePublication
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